ENIF2-Benchtop | Techvalley Co., Ltd.


Analysis X-ray

You can see the details information by clicking on the lower model name.

X-ray diffractometer
Structure of sample Non-destructive analysis equipment

ENIF2-Standalone (XRD)
ENIF2-Benchtop (XRD)

Inspection Item

  • Analysis
  • - X-ray diffraction
  • - Checking lattice constant from wavelength
  • - Applied new material synthesis, thin film deposition
  • - Checking lattice constant from angle

Peak Data
(Analysis & Comparison)

Specification

Specification
X-ray Tube 30kV / 10mA
Goniometer Geometry(2axis) Theta, 2 Theta
Software Data collection

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