TVXA-ENIF1 (SAXS) | Techvalley Co., Ltd.


Analysis X-ray

You can see the details information by clicking on the lower model name.

Small angle X-ray scattering
Analysis of nanostructure

TVXA-ENIF1 (SAXS)

Inspection Item

  • Analysis
  • - Small angle X-ray scattering
  • - Analysis of protein, drugs, etc.
  • - Analysis nanostructure of material
  • - Size, size distribution, shape, orientation
  • - Composite material, polymer analysis

Analysis Information

Specification

Specification
Incident beam Wavelength 1.54A / 8keV (Cu Kα)
Divergence ~ 0.4mrad FW20%M Both Planes
Beam size at focus 1.1 X 1.5㎟ at Mirror Exit
Distance Sample-to-Detector ~ 1.45 Meter
Slit Beam collimation 2 Sets of adjustable slits
Beam stopper Size 1.5 ~ 5Ø
Detector 2D-Positioning sensitive detector
Scattered beam Qmin
Beam flux at sample
position
(50kV, 0.6mA)
0.1076

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