ENIF2-Standalone(XRD)
(ENIF2-Benchtop) | Techvalley Co., Ltd.

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You can see the details information by clicking on the lower model name.

X-ray diffractometer
Structure of sample Non-destructive analysis equipment

ENIF2-Standalone (XRD)

ENIF2-Benchtop (XRD)

Inspection Item

Analysis

X-ray diffraction
Checking lattice constant from wavelength
Applied new material synthesis, thin film deposition
Checking lattice constant from angle

Peak Data
(Analysis & Comparison)

Specification

Specification
X-ray Tube	30kV / 10mA
Goniometer	Geometry(2axis) Theta, 2 Theta
Software	Data collection

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