Small angle X-ray scattering
Analysis of nanostructure
TVXA-ENIF1 (SAXS)
Inspection Item
- Analysis
- Small angle X-ray scattering
- Analysis of protein, drugs, etc.
- Analysis nanostructure of material
- Size, size distribution, shape, orientation
- Composite material, polymer analysis
Specification
Incident beam | Wavelength | 1.54A / 8keV (Cu Kα) |
---|---|---|
Divergence | ~ 0.4mrad FW20%M Both Planes | |
Beam size at focus | 1.1 X 1.5㎟ at Mirror Exit | |
Distance | Sample-to-Detector | ~ 1.45 Meter |
Slit | Beam collimation | 2 Sets of adjustable slits |
Beam stopper | Size | 1.5 ~ 5Ø |
Detector | 2D-Positioning sensitive detector | |
Scattered beam | Qmin Beam flux at sample position (50kV, 0.6mA) |
0.1076 |